An influence of loading in the probe-sample contact on the image quality of atomic force microscopes at semi-contact mode
Abstract
The results of the effect of relative loading on the quality of images of cancer cells and polymer material, obtained with atomic force microscopy in the dynamic tapping mode are described. It is shown that there are optimal loads for different probes, which produce images of the highest quality. The estimation of the loads are made.
About the Authors
A. A. Mohammed Salem
Белорусский национальный технический университет
Belarus
Belarus
E. S. Drozd
Институт тепло- и массообмена им. А. В. Лыкова НАН Беларуси; Генуэзский университет
Belarus
Belarus
S. A. Chizhik
Институт тепло- и массообмена им. А. В. Лыкова НАН Беларуси
Belarus
Belarus
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